AFM Probes » SuperSharp Enhanced

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
NT_SSE_v0010-5 Box of 5 AFM Probes
1 000.00 USD
Product availability: On stock

SuperSharp Enhanced

Ultrasharp EBD AFM whisker for high-resolution, non-contact AFM

Coating: Reflex Aluminum
Tip shape: Cone Shaped, Supersharp, EBD
Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
*nominal values

Applications

The SEMI standard for roughness measurements: 2 nm ultrahigh tip sharpness for non-contact AFM. Diamond-like hardness, long lifetime and imaging stability.

This product features alignment grooves on the back side of the holder chip.

Al reflex

AFM Tip:

  • AFM Spike:


  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 60 N/m)*
  • 320 kHz (270 - 370 kHz)*
  • 120 µm (115 - 125 µm)*
  • 30 µm (28 - 32 µm)*
  • 4.4 µm (3.9 - 4.9 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo