AFM Probes  »  
 Request a quote (RFQ)
Order Code / Price*
200AC-NA-10 Box of 10 AFM Probes
295.00 USD
200AC-NA-50 Box of 50 AFM Probes
1100.00 USD
Your volume discount is 375.00 USD or 25.40%
200AC-NA-100 Box of 100 AFM Probes
1880.00 USD
Your volume discount is 1070.00 USD or 36.30%
Product availability: On stock
Get a free MikroMasch poster


Soft Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning
AFM Cantilever
F 135 kHz
C 9 N/m
L 200 µm
*nominal values
How to optimize AFM scan parameters gear icon

The 200AC series of AFM probes is designed for tapping mode AFM imaging of standard and soft samples.

The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The aluminum reflective coating enhances laser reflectivity in air and UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 9 N/m (3 - 22 N/m)*
  • 135 kHz (85 - 175 kHz)*
  • 200 µm (190 - 210 µm)*
  • 40 µm (38 - 42 µm)*
  • 3.5 µm ( 3 - 4 µm)*
  • * typical range