AFM Probes » 200AC-NA

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Quantity
200AC-NA-10 Box of 10 AFM Probes
260.00 USD
200AC-NA-50 Box of 50 AFM Probes
990.00 USD
Your volume discount is 310.00 USD or 23.80%
200AC-NA-100 Box of 100 AFM Probes
1 690.00 USD
Your volume discount is 910.00 USD or 35.00%
Product availability: On stock
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200AC-NA

Soft Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflex Aluminum
AFM tip shape: OPUS
AFM Cantilever
F 135 kHz
C 9 N/m
L 200 µm
*nominal values

Applications

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The 200AC series of AFM probes is designed for tapping mode AFM imaging of standard and soft samples.

The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The aluminum reflective coating enhances laser reflectivity in air and UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 9 N/m (3 - 22 N/m)*
  • 135 kHz (85 - 175 kHz)*
  • 200 µm (190 - 210 µm)*
  • 40 µm (38 - 42 µm)*
  • 3.5 µm ( 3 - 4 µm)*
  • * typical range
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