AFM Probes » 3XC-NN

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Order Code / Price*
Quantity
3XC-NN-10 Box of 10 AFM Probes
260.00 USD
3XC-NN-50 Box of 50 AFM Probes
990.00 USD
Your volume discount is 310.00 USD or 23.80%
3XC-NN-100 Box of 100 AFM Probes
1 690.00 USD
Your volume discount is 910.00 USD or 35.00%
Product availability: On stock
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3XC-NN

AFM Probe with 3 Different Cantilevers for Various Applications and  Tips at the Very End of the Cantilevers

Coating: none
Tip shape: OPUS
This probe features 3 cantilevers
F 17 kHz
C 0.3 N/m
L 500 µm
F 150 kHz
C 9 N/m
L 175 µm
F 75 kHz
C 2.5 N/m
L 240 µm
*nominal values

Applications

The 3XC series features three different cantilevers for various measurement modes:
  • 500DC - Contact mode cantilever
  • 200AC - Standard AC mode cantilever
  • 240AC - Soft AC mode cantilever for imaging soft samples
The uncoated tips offer sharp tip apexes, chemical inertness and high cantilever Quality factors. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

Uncoated

AFM Tip:


  • 3 AFM Cantilevers:

    Contact mode cantilever
  • Beam
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 17 kHz (11 - 22 kHz)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (28 - 32 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • Standard tapping mode cantilever
  • Beam
  • 9 N/m (2.8 - 21 N/m)*
  • 150 kHz (100 - 200 kHz)*
  • 175 µm (165 - 185 µm)*
  • 40 µm (38 - 42 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • Soft tapping mode cantilever
  • Beam
  • 2.5 N/m (0.75 - 5.3 N/m)*
  • 75 kHz (50 - 100 kHz)*
  • 240 µm (230 - 250 µm)*
  • 30 µm (28 - 32 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
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