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3XC-NN

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Order Code / Price*
Quantity
3XC-NN-10 Box of 10 AFM Probes
320.00 USD
3XC-NN-50 Box of 50 AFM Probes
1200.00 USD
Your volume discount is 400.00 USD or 25.00%
3XC-NN-100 Box of 100 AFM Probes
1990.00 USD
Your volume discount is 1210.00 USD or 37.80%
Product availability: On stock
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3XC-NN

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Manufacturer: OPUS by MikroMasch

Coating: none
AFM tip shape: Optimized Positioning
This probe features 3 cantilevers
F 17 kHz
C 0.3 N/m
L 500 µm
F 150 kHz
C 9 N/m
L 175 µm
F 75 kHz
C 2.5 N/m
L 240 µm
*nominal values

Applications

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The 3XC series of AFM probes features three different AFM cantilevers for various measurement modes:

  • 500DC - Contact mode AFM cantilever
  • 200AC - Standard tapping mode AFM cantilever
  • 240AC - Soft tapping mode AFM cantilever

The uncoated AFM probes offer sharp AFM tip apexes, chemical inertness and high AFM cantilever quality factors.

The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.

Uncoated

AFM Tip:


  • 3 AFM Cantilevers:

    Contact mode cantilever
  • Beam
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 17 kHz (11 - 22 kHz)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (28 - 32 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • Standard tapping mode cantilever
  • Beam
  • 9 N/m (2.8 - 21 N/m)*
  • 150 kHz (100 - 200 kHz)*
  • 175 µm (165 - 185 µm)*
  • 40 µm (38 - 42 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • Soft tapping mode cantilever
  • Beam
  • 2.5 N/m (0.75 - 5.3 N/m)*
  • 75 kHz (50 - 100 kHz)*
  • 240 µm (230 - 250 µm)*
  • 30 µm (28 - 32 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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