AFM Probes » 4XC-NN

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Order Code / Price*
Quantity
4XC-NN-10 Box of 10 AFM Probes
260.00 USD
4XC-NN-50 Box of 50 AFM Probes
990.00 USD
Your volume discount is 310.00 USD or 23.80%
4XC-NN-100 Box of 100 AFM Probes
1 690.00 USD
Your volume discount is 910.00 USD or 35.00%
Product availability: On stock
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4XC-NN

AFM Probe with 4 Different Cantilevers  with Tips at the Very End of the Cantilevers

Coating: none
Tip shape: OPUS
This probe features 4 cantilevers
F 17 kHz
C 0.3 N/m
L 500 µm
F 75 kHz
C 2.5 N/m
L 240 µm
F 150 kHz
C 9 N/m
L 175 µm
F 1200 kHz
C 100 N/m
L 65 µm
*nominal values

Applications

The 4XC series features four different cantilevers for various measurement modes, two on each side of the holder chip:

500DC - Contact mode cantilever
240AC - Soft AC mode cantilever for imaging soft samples
200AC - Standard AC mode cantilever
65AC - High resonance frequency cantilever for High speed scanning

The uncoated version offers sharp tip apexes, chemical inertness and high cantilever Quality factors. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

Uncoated

AFM Tip:


  • 4 AFM Cantilevers:

    Contact mode cantilever
  • Beam
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 17 kHz (11 - 22 kHz)*
  • 3 µm (2.5 - 3.5 µm)*
  • Soft AC mode cantilever
  • Beam
  • 2.5 N/m (0.75 - 5.3 N/m)*
  • 75 kHz (50 - 100 kHz)*
  • 3 µm (2.5 - 3.5 µm)*
  • Standard AC mode cantilever
  • Beam
  • 9 N/m (2.8 - 21 N/m)*
  • 150 kHz (100 - 200 kHz)*
  • 3 µm (2.5 - 3.5 µm)*
  • High frequency AC mode cantilever
  • Beam
  • 100 N/m (35 - 215 N/m)*
  • 1200 kHz (650 - 1850 kHz)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
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