AFM Probes » 55AC-NA

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Order Code / Price*
Quantity
55AC-NA-5 Box of 5 AFM Probes
235.00 USD
55AC-NA-24 Box of 24 AFM Probes
975.00 USD
Your volume discount is 153.00 USD or 13.60%
55AC-NA-50 Box of 50 AFM Probes
1 895.00 USD
Your volume discount is 455.00 USD or 19.40%
55AC-NA-100 Box of 100 AFM Probes
3 550.00 USD
Your volume discount is 1 150.00 USD or 24.50%
Product availability: On stock
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55AC-NA

top value

Ultra High Frequency AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflex Aluminum
AFM tip shape: OPUS
AFM Cantilever
F 1200 kHz
C 85 N/m
L 65 µm
*nominal values

Applications

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The 55AC series of AFM probes is designed for high speed scanning (HSS) AFM imaging.

The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The aluminum reflective coating enhances laser reflectivity in air and UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 85 N/m (35 - 215 N/m)*
  • 1200 kHz (650 - 1850 kHz)*
  • 65 µm (55 - 75 µm)*
  • 31 µm (29 - 33 µm)*
  • 2.9 µm ( 2.4 - 3.4 µm)*
  • * typical range
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