Ultra High Frequency AFM Probe with AFM Tip at the Very End of the AFM Cantilever
The 55AC series of AFM probes is designed for high speed scanning (HSS) AFM imaging.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The aluminum reflective coating enhances laser reflectivity in air and UHV.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
This AFM probe features alignment grooves on the back side of the holder chip.