AFM Probes » 55AC-NA

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Order Code / Price*
Quantity
55AC-NA-5 Box of 5 AFM Probes
235.00 USD
55AC-NA-24 Box of 24 AFM Probes
975.00 USD
Your volume discount is 153.00 USD or 13.60%
55AC-NA-50 Box of 50 AFM Probes
1 895.00 USD
Your volume discount is 455.00 USD or 19.40%
55AC-NA-100 Box of 100 AFM Probes
3 550.00 USD
Your volume discount is 1 150.00 USD or 24.50%
Product availability: On stock
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55AC-NA

top value

Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip shape: OPUS
Cantilever:
F 1200 kHz
C 85 N/m
L 65 µm
*nominal values

Applications

The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of  the cantilever. This allows the tip to be positioned accurately over the are of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 85 N/m (35 - 215 N/m)*
  • 1200 kHz (650 - 1850 kHz)*
  • 65 µm (55 - 75 µm)*
  • 31 µm (29 - 33 µm)*
  • 2.9 µm (2.4 - 3.4 µm)*
  • * typical range
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