PeakForce Kelvin Probe Force Microscopy AFM Probes
PeakForce Tapping® Kelvin probe force microscopy (PF-KPFM™) measurements of surface potential
23 results matching your criteria
CONTPt
Electrical, Contact Mode AFM Probe
Coating:
Electrically Conductive
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
HQ:CSC37/Pt
AFM Probe with 3 Different Electrical, Contact Mode AFM Cantilevers
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
40 kHz
20 kHz
30 kHz
C
0.8 N/m
0.3 N/m
0.4 N/m
L
250 µm
350 µm
300 µm
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating:
various
Tip Shape: various
Tip Shape: various
