AFM Probes » ZEILR

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Order Code Price
ZEILR-10 Box of 10 AFM Probes
ZEILR-50 Box of 50 AFM Probes
$1 215.00
You save 320.00 USD or 20.80% with this box
ZEILR-W Box of 380 AFM Probes
$6 239.00
You save 5427.00 USD or 46.50% with this box
Product availability: On stock


Special Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard
F 27 kHz
C 1.6 N/m
L 450 µm
*nominal values
NanoWorld Pointprobe® ZEILR probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode probes of the CONT type the force constant is slightly increased.

The probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.
Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 1.6 N/m (1 - 2.6 N/m)*
  • 27 kHz (23 - 31 kHz)*
  • 450 µm (445 - 455 µm)*
  • 55 µm (50 - 60 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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