AFM Probes » HQ:NSC18/Pt

HQ:NSC18/Pt

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm
  • 27.5 µm
  • 3 µm
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?