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AFM Probes  »  

Conductive Dynamic Mode AFM Probes

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Conductive Dynamic Mode AFM Probes

Electrical characterization in dynamic mode operation (EFM, KPFM, etc.)
22 results matching your criteria
HQ:XSC11/Pt MikroMasch

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
155 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
NANOSENSORS™ Special Developments List (SDL) NANOSENSORS

NANOSENSORS™ Special Developments List (SDL)

Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating: various
Tip Shape: various
2
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