AFM Probes » ARROW-CONTPt

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Order Code Price
Quantity
ARROW-CONTPt-10 Box of 10 AFM Probes
€340.00
ARROW-CONTPt-20 Box of 20 AFM Probes
€612.00
You save 68.00 EUR or 10.00% with this box
ARROW-CONTPt-50 Box of 50 AFM Probes
€1 355.00
You save 345.00 EUR or 20.30% with this box
ARROW-CONTPt-W Box of 385 AFM Probes
€6 945.00
You save 6145.00 EUR or 46.90% with this box

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip shape: Arrow
Cantilever:
F 14 kHz
C 0.2 N/m
L 450 µm
*nominal values
Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm (445 - 455 µm)*
  • 45 µm (40 - 50 µm)*
  • 2 µm (1.5 - 2.5 µm)*
  • 0.2 N/m (0.06 - 0.38 N/m)*
  • 14 kHz (10 - 19 kHz)*
  • * typical range

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