AFM Probes » ElectriAll-In-One

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AIOE-10 Box of 10 AFM Probes
€219.00

ElectriAll-In-One

Electrical AFM Probe with 4 Different Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
*nominal values

Versatile monolithic silicon AFM probe with 4 different platinum coated cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: 

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)

The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the ElectriAll-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

BudgetSensors offers consistent high quality at a lower price!

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

  • Rotated
  • 17 µm (15 - 19 µm)*
  • 15 µm (10 - 20 µm)*
  • < 25 nm
  • 20°-25° front view, 25°-30° from side, 10° at the apex
  • AFM Cantilevers:

    Cantilever A - Contact Mode
  • Beam
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 0.2 N/m (0.04 - 0.7 N/m)*
  • 15 kHz (10 - 20 kHz)*
  • Cantilever B - Force Modulation
  • Beam
  • 210 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 2.7 N/m (0.4 - 10 N/m)*
  • 80 kHz (50 - 110 kHz)*
  • Cantilever C - Soft Tapping
  • Beam
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 7.4 N/m (1 - 29 N/m)*
  • 150 kHz (70 - 230 kHz)*
  • Cantilever D - Tapping Mode
  • Beam
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 40 N/m (7 - 160 N/m)*
  • 350 kHz (200 - 500 kHz)*
  • * typical range

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