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AFM Probes » ElectriMulti75-G
Order Code
Price
Quantity
Multi75E-G-10
Box of 10 AFM Probes
219
€219.00
Multi75E-G
Box of : max. 50 AFM Probes
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ElectriMulti75-G
Electrical, Force Modulation AFM Probe
best bang for the buck
*nominal values
Coating: Electrically Conductive
Tip shape: Rotated
Tip shape: Rotated
Cantilever:
F 75 kHz
C 3 N/m
L 225 µm
- Conductive AFM Probes
Applications
Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:
- scanning capacitance microscopy (SCM)
- electrostatic force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:
- Bruker / Veeco / Digital Instruments
- Keysight / Agilent / Molecular Imaging
- Asylum Research
- Park Systems
- JEOL
- JPK
- etc.
Consistent high quality at a lower price!
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.