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AFM Probes » ElectriMulti75-G
Order Code
Price
Quantity
Multi75E-G-10
Box of 10 AFM Probes
219
€219.00
Multi75E-G-50
Box of 50 AFM Probes
910
€910.00
50 pcs.
You save 185.00 EUR or 16.90% with this box
Multi75E-G
Box of : max. 50 AFM Probes
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AFM Probes together with other BudgetSensors AFM probes of your choice in a
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ElectriMulti75-G
Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip shape: Rotated
Tip shape: Rotated
Cantilever:
F 75 kHz
C 3 N/m
L 225 µm
- Conductive AFM Probes
Applications
Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:
- scanning capacitance microscopy (SCM)
- electrostatic force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
- scanning probe lithography
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:
- Digital Instruments / Veeco / Bruker
- Molecular Imaging / Agilent / Keysight
- Asylum Research
- Park Systems
- JEOL
- etc.
Consistent high quality at a lower price!
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.