AFM Probes » SSS-SEIH

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Order Code Price
Quantity
SSS-SEIH-10 Box of 10 AFM Probes
€653.00
SSS-SEIH-50 Box of 50 AFM Probes
€2 576.00
You save 689.00 EUR or 21.10% with this box
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Coating: None
Tip shape: Supersharp
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values
For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 3:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 33 µm (30 - 45 µm)*
  • 5 µm (4 - 6 µm)*
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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