AFM Probes » SSS-SEIHR

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Order Code Price
Quantity
SSS-SEIHR-10 Box of 10 AFM Probes
€653.00
SSS-SEIHR-50 Box of 50 AFM Probes
€2 576.00
You save 689.00 EUR or 21.10% with this box
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

SSS-SEIHR

SuperSharp, Special Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Supersharp
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH  type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 33 µm (30 - 45 µm)*
  • 5 µm (4 - 6 µm)*
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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