AFM Probes » ZEIHR

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Order Code Price
ZEIHR-10 Box of 10 AFM Probes
ZEIHR-50 Box of 50 AFM Probes
€1 125.00
You save 300.00 EUR or 21.10% with this box
ZEIHR-W Box of 385 AFM Probes
€5 777.00
You save 5195.50 EUR or 47.40% with this box
Product availability: Available on demand. Please contact us for availability!


Special Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard
F 130 kHz
C 27 N/m
L 225 µm
*nominal values

NanoWorld Pointprobe® ZEIHR probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 27 N/m (17 - 41 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • 225 µm (220 - 230 µm)*
  • 57 µm (52.5 - 62.5 µm)*
  • 5 µm (4.5 - 5.5 µm)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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