AFM Probes » HQ:CSC38/tipless/Cr-Au

HQ:CSC38/tipless/Cr-Au

Tipless AFM Probe with 3 Different Gold Coated Contact Mode Cantilevers

Coating: Gold Overall
Tip shape: Tipless
This probe features 3 cantilevers
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
*nominal values
Probes of the 38/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on both sides of the cantilever. The coating may cause cantilever bending within 3°.
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both sides of the cantilever.

AFM Tip:

  • Tipless
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 250 µm
  • 32.5 µm
  • 1 µm
  • 0.09 N/m (0.01 - 0.36 N/m)*
  • 20 kHz (8 - 32 kHz)*
  • Cantilever B
  • Beam
  • 350 µm
  • 32.5 µm
  • 1 µm
  • 0.03 N/m (0.003 - 0.13 N/m)*
  • 10 kHz (5 - 17 kHz)*
  • Cantilever C
  • Beam
  • 300 µm
  • 32.5 µm
  • 1 µm
  • 0.05 N/m (0.005 - 0.21 N/m)*
  • 14 kHz (6 - 23 kHz)*
  • * typical range

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