AFM Probes » HiRes-C15/Cr-Au

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HiRes-C15/Cr-Au-5 Box of 5 AFM Probes
Product availability: On stock
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit


High Resolution, Tapping Mode AFM Probe

Coating: Reflex Gold
Tip shape: Supersharp
F 325 kHz
C 40 N/m
L 125 µm
*nominal values
Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.

High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.
Cr-Au coating on both sides of the cantilever. The coating does not cover the extratip!

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (27 - 33 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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