AFM Probes » HQ:CSC17/No Al

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HQ:CSC17/No Al-15 Box of 15 AFM Probes
HQ:CSC17/No Al-50 Box of 50 AFM Probes
You save 150.00 EUR or 15.00% with this box
HQ:CSC17/No Al-100 Box of 100 AFM Probes
€1 530.00
You save 470.00 EUR or 23.50% with this box
HQ:CSC17/No Al-200 Box of 200 AFM Probes
€2 720.00
You save 1280.00 EUR or 32.00% with this box
HQ:CSC17/No Al-400 Box of 400 AFM Probes
€4 080.00
You save 3920.00 EUR or 49.00% with this box

HQ:CSC17/No Al

Standard Contact Mode AFM Probe

Coating: None
Tip shape: Rotated
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm
  • 50 µm
  • 2 µm
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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