AFM Probes » HQ:CSC37/Pt

HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 3 cantilevers
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
*nominal values
Probes of the 37 series have three different contact mode cantilevers on one side of the holder chip. They can be used for different electrical measurements.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 30 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 250 µm
  • 35 µm
  • 2 µm
  • 0.8 N/m (0.3 - 2 N/m)*
  • 40 kHz (30 - 55 kHz)*
  • Cantilever B
  • Beam
  • 350 µm
  • 35 µm
  • 2 µm
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 20 kHz (15 - 30 kHz)*
  • Cantilever C
  • Beam
  • 300 µm
  • 35 µm
  • 2 µm
  • 0.4 N/m (0.1 - 1 N/m)*
  • 30 kHz (20 - 40 kHz)*
  • * typical range

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