AFM Probes » HQ:CSC38/Al BS

HQ:CSC38/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers

Coating: Reflex Aluminum
Tip shape: Rotated
This probe features 3 cantilevers
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
*nominal values
Probes of the 38 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 8 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 250 µm
  • 32.5 µm
  • 1 µm
  • 0.09 N/m (0.01 - 0.36 N/m)*
  • 20 kHz (8 - 32 kHz)*
  • Cantilever B
  • Beam
  • 350 µm
  • 32.5 µm
  • 1 µm
  • 0.03 N/m (0.003 - 0.13 N/m)*
  • 10 kHz (5 - 17 kHz)*
  • Cantilever C
  • Beam
  • 300 µm
  • 32.5 µm
  • 1 µm
  • 0.05 N/m (0.005 - 0.21 N/m)*
  • 14 kHz (6 - 23 kHz)*
  • * typical range

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