AFM Probes » HQ:NSC36/Hard/Al BS

HQ:NSC36/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Force Modulation Mode Cantilevers

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
This probe features 3 cantilevers
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various applications.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 20 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 32.5 µm
  • 1 µm
  • 1 N/m (0.1 - 4.6 N/m)*
  • 90 kHz (30 - 160 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 32.5 µm
  • 1 µm
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 32.5 µm
  • 1 µm
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • * typical range

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