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160AC-NA

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Order Code / Price*
Quantity
160AC-NA-10 Box of 10 AFM Probes
295.00 USD
160AC-NA-50 Box of 50 AFM Probes
1100.00 USD
Your volume discount is 375.00 USD or 25.40%
160AC-NA-100 Box of 100 AFM Probes
1880.00 USD
Your volume discount is 1070.00 USD or 36.30%
Product availability: On stock
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160AC-NA

top value

Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Aluminum
AFM tip shape: OPUS
AFM Cantilever
F 300 kHz
C 26 N/m
L 160 µm
*nominal values

Applications

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The 160AC series of AFM probes is designed for standard tapping or non-contact mode AFM imaging in air or vacuum.

The uncoated AFM tip offers a sharp tip apex and chemical inertness. The aluminum reflective coating enhances laser reflectivity in air and UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 26 N/m (8 - 57 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 160 µm (150 - 170 µm)*
  • 40 µm (38 - 42 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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