AFM Probes » 160AC-NA

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Order Code / Price*
Quantity
160AC-NA-10 Box of 10 AFM Probes
260.00 USD
160AC-NA-50 Box of 50 AFM Probes
990.00 USD
Your volume discount is 310.00 USD or 23.80%
160AC-NA-100 Box of 100 AFM Probes
1 690.00 USD
Your volume discount is 910.00 USD or 35.00%
Product availability: On stock
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160AC-NA

Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip shape: OPUS
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
*nominal values

Applications

The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 26 N/m (8 - 57 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 160 µm (150 - 170 µm)*
  • 40 µm (38 - 42 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range
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