AFM Probes » 200AC-NA

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Order Code Price
200AC-NA-10 Box of 10 AFM Probes
200AC-NA-50 Box of 50 AFM Probes
You save 150.00 EUR or 15.00% with this box
200AC-NA-100 Box of 100 AFM Probes
€1 530.00
You save 470.00 EUR or 23.50% with this box
Product availability: On stock


Soft Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip shape: OPUS
F 135 kHz
C 9 N/m
L 200 µm
*nominal values
The 200AC series is designed for AC mode AFM imaging of standard and soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
30 nm Al on the back side of the cantilever

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 9 N/m (3 - 22 N/m)*
  • 135 kHz (85 - 175 kHz)*
  • 200 µm (190 - 210 µm)*
  • 40 µm (38 - 42 µm)*
  • 3.5 µm (3 - 4 µm)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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