AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM Tips at the Very End of the AFM Cantilevers
The 3XC series of AFM probes features three different AFM cantilevers for various measurement modes:
The uncoated AFM tips offer sharp AFM tip apexes and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and UHV.
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.