AFM Probes » PPP-CONTSC

 Order  Request a quote (RFQ)
Order Code Price
Quantity
PPP-CONTSC-10 Box of 10 AFM Probes
$320.00
PPP-CONTSC-20 Box of 20 AFM Probes
$573.00
You save 67.00 USD or 10.50% with this box
PPP-CONTSC-50 Box of 50 AFM Probes
$1 265.00
You save 335.00 USD or 20.90% with this box
PPP-CONTSC-W Box of 380 AFM Probes
$6 409.00
You save 5751.00 USD or 47.30% with this box

PPP-CONTSC

Contact Mode AFM Probe with Short Cantilever

Coating: None
Tip shape: Standard
Cantilever:
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values
The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The NANOSENSORSPPP-CONTSC is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

The probe offers unique features:
  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 48 µm (40 - 55 µm)*
  • 1 µm (0.1 - 2 µm)*
  • 0.2 N/m (0.01 - 1.87 N/m)*
  • 25 kHz (1 - 57 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?