AFM Probes » HQ:CSC37/Cr-Au

HQ:CSC37/Cr-Au

AFM Probe with 3 Different Gold Coated Contact Mode Cantilevers

Coating: Gold Overall
Tip shape: Rotated
This probe features 3 cantilevers
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
*nominal values
Probes of the 37 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 35 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 250 µm
  • 35 µm
  • 2 µm
  • 0.8 N/m (0.3 - 2 N/m)*
  • 40 kHz (30 - 55 kHz)*
  • Cantilever B
  • Beam
  • 350 µm
  • 35 µm
  • 2 µm
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 20 kHz (15 - 30 kHz)*
  • Cantilever C
  • Beam
  • 300 µm
  • 35 µm
  • 2 µm
  • 0.4 N/m (0.1 - 1 N/m)*
  • 30 kHz (20 - 40 kHz)*
  • * typical range

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