AFM Probes » HQ:NSC15/Hard/Al BS

HQ:NSC15/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
*nominal values
Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 30 µm
  • 4 µm
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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