AFM Probes » HQ:NSC35/tipless/Cr-Au

HQ:NSC35/tipless/Cr-Au

Tipless AFM Probe with 3 Different Gold Coated Tapping Mode Cantilevers

Coating: Gold Overall
Tip shape: Tipless
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values
Probes of the 35/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on both sides of the cantilever. The coating may cause cantilever bending within 3°.
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both sides of the cantilever.

AFM Tip:

  • Tipless
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 35 µm
  • 2 µm
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 35 µm
  • 2 µm
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 35 µm
  • 2 µm
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • * typical range

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