AFM Probes » qp-SCONT

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Order Code Price
Quantity
qp-SCONT-10 Box of 10 AFM Probes
$395.00
qp-SCONT-20 Box of 20 AFM Probes
$695.00
You save 95.00 USD or 12.00% with this box
qp-SCONT-50 Box of 50 AFM Probes
$1 545.00
You save 430.00 USD or 21.80% with this box
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ESD Kit recommended with this product. Click here to order: ESD Kit

qp-SCONT

uniqprobe™ - uniform quality SPM probe for soft contact mode

Coating: Reflex Gold
Tip shape: Circular symmetric
Cantilever:
F 11 kHz
C 0.01 N/m
L 125 µm
*nominal values

The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.

NANOSENORS qp-SCONT AFM probes are designed for contact mode AFM imaging in air or liquid environments. The SCONT type features a very low force constant offering the possibility of contact mode measurements on soft biological materials with high sensitivity.

The probe offers unique features:

  • small dispersion of force constant and resonance frequency 
  • typical tip height 7µm 
  • typical tip radius of curvature smaller than 10nm
  • stress free cantilevers with considerably less bending
  • tip and cantilevers are made of a quartz-like material
  • reduced drift for applications in liquid environments
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
  • chemically inert
A chromium/gold layer of about 60nm is partially coating the cantilever on the detector side near its free end where the tip is situated. The main advantages of this partial metallic coating are considerably less cantilever bending and reduced drift for SPM measurements in liquid environments.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (120 - 130 µm)*
  • 34 µm (32 - 36 µm)*
  • 350 nm (320 - 380 nm)*
  • 0.01 N/m (0.006 - 0.015 N/m)*
  • 11 kHz (8 - 13 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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