News » NanoAndMore Introducing OPUS™ AFM Tips, featuring Tip Visibility

December 1st, 2015

NanoAndMore announces the introduction of a new line of AFM tips – OPUS™ by MikroMasch®

Opus LogoThe key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.

Other important features of OPUS™ AFM probes are:

• Tip radius smaller than 7 nm
• High Q-factor and smooth resonance curves
• Excellent cost/performance ratio

For samples and more information please visit www.nanoandmore.com/USA or www.opustips.com or just contact us