News » NanoWorld AG introduces Ultra-Short Cantilevers for High-Speed Atomic Force Microscopy (HS-AFM)

Lady’s Island, SC -  February 21st 2014
 
USC cantilever 3D view close-upNanoAndMore USA today announced that NanoWorld commercializes six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM).
High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe Microscopy that enables the users of dedicated instruments and AFM probes to visualize dynamic processes at the single molecule level. (See also www.highspeedscanning.com).

After a very successful beta-testing phase six types of AFM probes for high speed scanning will be commercially available from now on.

In order to provide a suitable probe for the complete range of high speed scanning applications, the NanoWorld Ultra-Short Cantilevers series consist of six different types of AFM probes divided in 2 categories.

 
Three types of Ultra-Short Cantilevers with very high resonance frequencies (1.2 MHz – 5 MHz) and high force constants are mainly meant for use in dynamic mode applications in air.

        •    USC-F5-k30
        •    USC-F2-k3
        •    USC-F1.2-k7.3
 
 
Three further types of Ultra-Short Cantilevers with high resonance frequencies and low force constants (0.6 N/m – 0.15 N/m) are mainly dedicated for applications in liquid.
 
        •    USC-F1.5-k0.6
        •    USC-F1.2-k0.15
        •    USC-F0.3-k0.3
 
All AFM probes of the USC type feature a wear resistant  tip made from High Density Carbon/Diamond Like Carbon (HDC/DLC) with a typical tip height of 2.5 µm and a radius of curvature typically < 10 nm. The aspect ratio is typically 5:1 and the tilt compensation is 8°.
 
The cantilevers are coated with gold on both sides but the tip remains uncoated.
 
A screencast on the new USC probes has already been uploaded on the NanoWorld YouTube Chanel
 
A dedicated website for HS-AFM www.highspeedscanning.com also shows not only the commercialized types of AFM probes for high speed scanning but also application examples by well-known researchers in the field as well as literature references on this growing field of research.
 
For more information please refer to the above listed spec sheets have a look at the NanoWorld screencast on Ultra-Short Cantilevers or contact us at usa@nanoandmore.com.