Last exhibition day at 2023 MRS Fall Meeting & ExhibitThu Nov 30 2023
Last exhibition day at 2023 MRS Fall Meeting & Exhibit Materials Research Society and the last day to have a look at our 3D printed #AFMtip scale models, find out about the many different #AFMprobes we offer and pick up some Swiss chocolate.
Opening hours today Thursday, November 30 10:00 am – 1:00 pm
Did you know that we now also sell the original Olympus AFM probes?Wed Nov 29 2023
It’s the second exhibition day at 2023 MRS Fall.
Did you know that we now also sell the original Olympus #AFMprobes?
Visit us today at booth # 904 to find out more.
Opening times Wednesday, November 29 10:00 am – 6:00 pm
NanoWorld at MRS Fall Meeting & Exhibit 2023 this weekTue Nov 28 2023
NanoWorld CEO Manfred Detterbeck is in Boston for the MRS Fall 2023 Meeting & Exhibit this week.
Will you be there too? You’ll meet him at some of the sessions or at NanoAndMore USA booth no. 904.
NanoAndMore at MRS Fall Meeting and Exhibit in BostonMon Nov 27 2023
We're all set up and exited to be able to welcome you at this year's MRS Fall Meeting and Exhibit in Boston.
Exhibition hours tomorrow Tuesday, November 28 11:00 am – 6:00 pm
See you soon!
E-AFM Nanolithography Approach Enables High-Resolution NanopatterningThu Nov 23 2023
Discover how nanotools 500nm long, tilt compensated, high aspect ratio MCNT-500™ is applied for imaging and characterization of lithography features dimensions (depth and width).
https://www.nanotools.com/blog/e-afm-nanolithography-approach-enables-high-resolution-nanopatterning.html
Title: Electric-Field-Assisted Contact Mode Atomic Force Microscope-Based Nanolithography With Low Stiffness Conductive Probes
Authors: Zhou, H., Jiang, Y., Dmuchowski, C. M., Ke, C., and Deng, J.
Publication: Journal of Micro- and Nano-Manufacturing
Publisher: ASME International
Date: 28 April 2022
MikroMasch XSC11/Al BS AFM probes support the investigation of flexible magnetic films derived from bacterial nanocelluloseMon Nov 20 2023
The light tapping mode cantilevers of our 4-lever MikroMasch XSC11/Al BS AFM probes support the investigation of flexible magnetic films derived from bacterial nanocellulose.
NanoAndMore Europe booth at Operando SPM 2023 at the Fritz Haber Institute of the Max Planck SocietySun Nov 19 2023
Thank you for visiting the NanoAndMore Europe booth at Operando SPM 2023 at the Fritz Haber Institute of the Max Planck Society this week where we were one of the proud sponsors. We hope to see you again to talk more about what kind of #AFMprobes you need for your #atomicforcemicroscopy application.
Imaging of nanoscale charge dynamics demonstrated with BudgetSensors Multi75-G AFM probesThu Nov 09 2023
Researchers at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory have developed a novel high-speed sparse scanning Kelvin probe force microscopy (SS-KPFM) technique which allows sub-second imaging of nanoscale charge dynamics demonstrated with BudgetSensors Multi75-G AFM probes. Measurements on BudgetSensors KPFM & EFM Sample reveal improvement in resolution over classical amplitude modulated KPFM.
NanoAndMore Japan CEO Nobuhiro Saito and NanoWorld CEO Manfred Detterbeck visited the Nano Life Science Institute at Kanazawa UniversityThu Nov 09 2023
NanoAndMore Japan CEO Nobuhiro Saito and NanoWorld CEO Manfred Detterbeck visited the Nano Life Science Institute at Kanazawa University today to discuss their needs for #AFMprobes for #highspeedatomicforcemicroscopy ( #HSAFM ) and all the other applications the many active researchers there are working on.
Happy HalloweenTue Oct 31 2023
Do you remember our 30th anniversary when we gave away the free NANOSENSORS #fungratings?
#Halloween is here again and it is time to let the creepy, crawly creatures, monsters and others escape from the NANOSENSORS fun grating in the lab again.
Our Jack O’Lanterns are two examples. There are many more to discover.
Share with us what you’ve discovered while scanning your fun grating with your #atomicforcemicroscope.
Happy Halloween!
Developing High-Performance Optoelectronic and Electronic DevicesThu Oct 26 2023
Discover how nanotools EBD-NCH with consistent radius are applied for investigating morphology and nucleation of Te crystallites/2D 2H-MoTe2 films.
https://link.springer.com/article/10.3938/jkps.76.167
Title: Van der Waals Heteroepitaxy of Te Crystallites/2H-MoTe2 Atomically Thin Films on GaAs Substrates by Using Metal-Organic Chemical-Vapor Deposition
Authors: Tae Wan Kim, Donghwan Kim, Yonghee Jo, Jonghoo Park, Hyun-Seok Kim & ChaeHo Shin
Publication: Journal of the Korean Physical Society
Publisher: Springer Nature
Date: Jan 27, 2020
BudgetSensors Tap300Al-G AFM probes used in a studyWed Oct 25 2023
Research on dinuclear complex-induced DNA melting is supported by submolecular resolution imaging using BudgetSensors Tap300Al-G AFM probes.
C-Axis Textured, 2–3 μm Thick Al0.75Sc0.25N Films Grown on Chemically Formed TiN/Ti Seeding Layers for MEMS ApplicationsFri Oct 20 2023
C-Axis Textured, 2–3 μm Thick Al0.75Sc0.25N Films Grown on Chemically Formed TiN/Ti Seeding Layers for MEMS Applications
In the search for lead-free, Si-microfabrication-compatible piezoelectric materials, thin films of scandium-doped aluminum nitride (Al,Sc)N are of great interest for use in actuators, energy harvesting, and micro-electromechanical-systems (MEMS).* While the piezoelectric response of AlN increases upon doping with Sc, difficulties are encountered during film preparation because, as bulk solids with completely different structures and large
#AFMProbes, #AfmTips, #AFMTopographyImaging, #AFMカンチレバー, #AFMプローブ, #AFM探针, #AluminumScandiumNitride, #ApplicationOfFerroelectricThinFilmsInMEMS, #AtomicForceMicroscopy, #NanoscaleTopography, #PeakForceTapping, #Piezoelectric, #PNPTRS, #PyrexNitrideAFMProbes, #SeedingLayer, #SiliconNitrideAFMProbes, #Sputtering, #SurfaceTopography, #Texture, #ThinFilms
A study supported by our HQ:CSC37 series silicon AFM probesMon Oct 16 2023
Quantifying the viscosity of individual submicrometer semisolid particles is supported by our HQ:CSC37 series silicon AFM probes.
“The diffusion time scale of atmospheric gases into an aerosol is largely governed by its viscosity, which in turn influences heterogeneous chemistry and climate-relevant aerosol effects.”
Effective Solid Electrolyte Interphase Formation on Lithium Metal Anodes by Mechanochemical ModificationThu Oct 12 2023
Magnetic skyrmions are promising information carriers for dense and energy-efficient information storage owing to their small size, low driving-current density, and topological stability.*
Electrical detection of skyrmions is a crucial requirement to drive skyrmion devices toward applications. The use of a magnetic tunnel junction (MTJ) is commonly suggested for this purpose as MTJs are key spintronic devices for large-scale commercialization that can convert magnetic textures into electrical signals. To date, however, it has been challenging to realize skyrmions in MTJs due to incompatibility between standard skyrmion materials and highly efficient MTJ electrodes.*
In the article “Electrical Detection of Magnetic Skyrmions in a Magnetic Tunnel Junction” Yao Guang, Like Zhang, Junwei Zhang, Yadong Wang, Yuelei Zhao, Riccardo Tomasello, Senfu Zhang, Bin He, Jiahui Li, Yizhou Liu, Jiafeng Feng, Hongxiang Wei, Mario Carpentieri, Zhipeng Hou, Junming Liu, Yong Peng, Zhongming Zeng, Giovanni Finocchio, Xixiang Zhang, John Michael David Coey, Xiufeng Han and Guoqiang Yu report a material stack combining magnetic multilayers, which host 100 nm scale skyrmions, with a perpendicularly magnetized MTJ.*
In their article the authors describe how they combined electrical transport measurements with direct imaging of magnetic texture by magnetic force microscopy (MFM).*
The materials stack is designed to imprint the magnetic domain pattern of the multilayer into the MTJ’s free layer via magnetostatic interactions. The evolution of the magnetic domain pattern is revealed by MFM, which shows that skyrmions can be stabilized in the fabricated MTJ with an appropriate magnetic field.*
The realization of electrical reading of skyrmions using an MTJ opens the route to all-electrical skyrmion devices, which is a crucial step for the development of skyrmionics. *
The technique reported by Yao Guang et al. can further advance the simultaneous optimization of the parameters for skyrmion stabilization and MTJ read-out, thus opening a way to realize skyrmion-based devices such as racetrack memory, logic gates, oscillators, detectors,artificial synapses for neuromorphic computing, and reshuffling devices with an efficient CMOS compatible read-out mechanism.*
The magnetic response was studied using NANOSENSORS™ SuperSharpSilicon™ High Resolution Magnetic Force Microscopy AFM Probes ( SSS-MFMR typical force constant 2.8 N/m) in-phase mode and with a lift height of 30 nm. The transport measurements of MTJ were performed in the PPMS or the MFM that is upgraded with electrical measurement equipment.*
Please have a look at the NANOSENSORS for the full citation and a direct link to the full article.
Multi75-G AFM probes are used in tapping mode, bimodal AFM, force spectroscopy and energy analysisMon Oct 09 2023
This study investigates the stiffening of the commonly used biodegradable polymer polylactic acid (PLA) by salification with impact on applications such as artificial heart valves. Our Multi75-G AFM probes are used in tapping mode, bimodal AFM, force spectroscopy and energy analysis (power dissipation) to determine changes in material properties. Find out which AFM technique the authors determine the most sensitive!
Intrinsically disordered regions in TRPV2 mediate protein-protein interactionsFri Oct 06 2023
Intrinsically disordered regions in TRPV2 mediate protein-protein interactions
Transient receptor potential (TRP) ion channels are gated by diverse intra- and extracellular stimuli leading to cation inflow (Na+, Ca2+) regulating many cellular processes and initiating organismic somatosensation. * Structures of most TRP channels have been solved. However, structural and sequence analysis showed that ~30% of the TRP channel sequences, mainly the N- and C-termini, […]
#AtomicForceMicroscopy, #Biology, #BiologyAFMProbes, #Biophysics, #CellBiology, #CellularProcesses, #HighSpeedAFM, #HighSpeedAtomicForceMicroscopy, #HSAFM, #IonTransport, #MembraneStructure, #TRPChannels, #TRPV2, #UltraHighFrequencyAFMCantilevers, #UltraHighFrequencyAFMProbes, #UltraShortAFMCantilevers, #USC, #USCF12K015, #VideoRateAFM, #高速AFM, #高速AFMカンチレバー, #高速AFMプローブ, #高速AFM探针, #高速原子力显微镜, #高速原子力显微镜探针
Electrical Detection of Magnetic Skyrmions in a Magnetic Tunnel JunctionWed Oct 04 2023
Magnetic skyrmions are promising information carriers for dense and energy-efficient information storage owing to their small size, low driving-current density, and topological stability.*
Electrical detection of skyrmions is a crucial requirement to drive skyrmion devices toward applications. The use of a magnetic tunnel junction (MTJ) is commonly suggested for this purpose as MTJs are key spintronic devices for large-scale commercialization that can convert magnetic textures into electrical signals. To date, however, it has been challenging to realize skyrmions in MTJs due to incompatibility between standard skyrmion materials and highly efficient MTJ electrodes.*
In the article “Electrical Detection of Magnetic Skyrmions in a Magnetic Tunnel Junction” Yao Guang, Like Zhang, Junwei Zhang, Yadong Wang, Yuelei Zhao, Riccardo Tomasello, Senfu Zhang, Bin He, Jiahui Li, Yizhou Liu, Jiafeng Feng, Hongxiang Wei, Mario Carpentieri, Zhipeng Hou, Junming Liu, Yong Peng, Zhongming Zeng, Giovanni Finocchio, Xixiang Zhang, John Michael David Coey, Xiufeng Han and Guoqiang Yu report a material stack combining magnetic multilayers, which host 100 nm scale skyrmions, with a perpendicularly magnetized MTJ.*
In their article the authors describe how they combined electrical transport measurements with direct imaging of magnetic texture by magnetic force microscopy (MFM).*
The materials stack is designed to imprint the magnetic domain pattern of the multilayer into the MTJ’s free layer via magnetostatic interactions. The evolution of the magnetic domain pattern is revealed by MFM, which shows that skyrmions can be stabilized in the fabricated MTJ with an appropriate magnetic field.*
The realization of electrical reading of skyrmions using an MTJ opens the route to all-electrical skyrmion devices, which is a crucial step for the development of skyrmionics. *
The technique reported by Yao Guang et al. can further advance the simultaneous optimization of the parameters for skyrmion stabilization and MTJ read-out, thus opening a way to realize skyrmion-based devices such as racetrack memory, logic gates, oscillators, detectors,artificial synapses for neuromorphic computing, and reshuffling devices with an efficient CMOS compatible read-out mechanism.*
The magnetic response was studied using NANOSENSORS™ SuperSharpSilicon™ High Resolution Magnetic Force Microscopy AFM Probes ( SSS-MFMR typical force constant 2.8 N/m) in-phase mode and with a lift height of 30 nm. The transport measurements of MTJ were performed in the PPMS or the MFM that is upgraded with electrical measurement equipment.*
Please have a look at the NANOSENSORS for the full citation and a direct link to the full article.
MikroMasch HQ:CSC37/No Al and HQ:CSC37/tipless/Al BS AFM probes used in a studyTue Oct 03 2023
Research teams from the UIUC investigate the friction between single-layer graphene and AFM tips under external electric fields with the help of MikroMasch HQ:CSC37/No Al and HQ:CSC37/tipless/Al BS AFM probes.
“While the primary effect in most systems is electrostatically controllable adhesion, graphene in contact with semiconducting tips exhibits a regime of unexpectedly enhanced and highly tunable friction.”
Highlights
AFM Probe Focus
best of the best
qp-HBC
uniqprobe™ - HeartBeat Cantilever for ScanAsyst®** and Peak Force Tapping™**
Coating:
Reflective Aluminum
Tip Shape: Circular symmetric
Tip Shape: Circular symmetric
AFM Cantilever:
F
60 kHz
C
0.5 N/m
L
115 µm
ATEC-NC
Tapping Mode AFM Probe with REAL Tip Visibility
Coating:
none
Tip Shape: Visible
Tip Shape: Visible
AFM Cantilever:
F
335 kHz
C
45 N/m
L
160 µm
TESPA
Standard Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
OTESPA
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Reflective Aluminum
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
