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Lateral Calibration Standards
Select a category
Height Calibration Standards
Other Calibration Artifacts
Lateral Calibration Standards
HOPG
ESD Kit
Electronic Devices
Lateral Calibration Standards
Lateral-(xy)-Calibration Standard (2D200)
Standard for Precise Lateral Calibration with 200 nm Pitch
TGXYZ02
XYZ Calibration Grating, 100nm Step Height, 5µm and 10µm Pitch
TGX
Grating with Undercut Edge Structures for Lateral Calibration and AFM Tip Aspect Ratio Determination
CS-20NG
XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height
TGXYZ01
XYZ Calibration Grating, 20nm Step Height, 5µm and 10µm Pitch
TGXYZ03
XYZ Calibration Grating, 500nm Step Height, 5µm and 10µm Pitch
TGF11
Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity Assessment
145TC
Traceable Calibration Specimen, 1-dimensional, 144nm Nominal Period, Al on Glass
150-1D
Calibration Specimen, 1-dimensional, 144nm Nominal Period, Al on Glass
150-2D
Calibration Specimen, 2-dimensional, 144nm Nominal Period, Al on Si
300-1D
Calibration Specimen, 1-dimensional, 288nm Nominal Period, W-coated Photoresist on Si
300-2D
Calibration Specimen, 2-dimensional, 297nm Nominal Period, Aluminum Bumps on Si
302-edu
Student Grade Calibration Specimen, 2-dimensional, 297nm Nominal Period, Aluminum Bumps on Si
301BE
Calibration Specimen, 1-dimensional, 292nm Nominal Period, Ti on Si
70-1D
Calibration Specimen, 1-dimensional, 70nm Nominal Period, HSQ Resist (Silicon Oxide) on Si.
700-1D
Calibration Specimen, 1-dimensional, 700nm Nominal Period, W-coated Photoresist on Si
700-2D
Calibration Specimen, 2-dimensional, 700nm Nominal Period, W-coated Photoresist on Si
750-HD
750-HD
Calibration Specimen, 1-dimensional, 750nm Period, 100nm Height
751-HD
Nickel NanoChannel Array Substrate, Width 370nm, Depth 180nm
SEM Mount
SEM Mount Service for ASM Calibration Specimen