1 Single AFM Cantilever per AFM Probe

CP-FM-PM

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, PMMA
Sphere Diameter: 1.84 - 14.59 µm

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

CP-FM-PS

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, Polystyrene
Sphere Diameter: 1.98 - 14.45 µm

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

CP-FM-SiO

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball.

Coating: none
Tip Shape: Sphere, Silicon Dioxide
Sphere Diameter: 2.1 - 15 µm

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

CP-NCH-Au

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, Gold
Sphere Diameter: 1.5 - 9 µm

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

CP-NCH-BSG

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, Borosilicate Glass
Sphere Diameter: 2.5 - 20 µm

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

CP-NCH-PM

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, PMMA
Sphere Diameter: 1.84 - 14.59 µm

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

CP-NCH-PS

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, Polystyrene
Sphere Diameter: 1.98 - 14.45 µm

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

CP-NCH-SiO

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
Tip Shape: Sphere, Silicon Dioxide
Sphere Diameter: 2 - 15 µm

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

Q-WM190-SSS

Premounted, SuperSharp Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Supersharp

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

Q-AR5

Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

Q-WM300

Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Q-CONT

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-EFM

Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-MFM

Premounted Hard Magnetic, Medium Momentum MFM AFM Probe, for Quesant/Ambios AFM systems

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-Cond-E

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-WM75

Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-WM150

Premounted Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

best bang for your buck

Q-WM190

Premounted Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NANOSENSORS™ Special Developments List (SDL)

Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise

Coating: various
Tip Shape: various