Rotated AFM Tips

AFM probes with rotated 4-sided pyramidal macroscopic shape of the AFM tips
118 results matching your criteria
SHR300

SHR300

High Resolution Tapping Mode AFM Probe
Coating: Reflex Gold
Tip Shape: Supersharp
AFM Cantilever:
F 300 kHz
C 40 N/m
L 125 µm
SuperSharp Enhanced

SuperSharp Enhanced

Ultrasharp EBD AFM whisker for high-resolution, non-contact AFM
Coating: Reflex Aluminum
Tip Shape: Cone Shaped,Supersharp,EBD
AFM Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
HQ:NSC16/Hard/Al BS

HQ:NSC16/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe with Long Cantilever
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilever:
F 190 kHz
C 45 N/m
L 225 µm
HQ:NSC36/Hard/Al BS

HQ:NSC36/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Force Modulation Mode Cantilevers
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
HQ:XSC11/Hard/Al BS

HQ:XSC11/Hard/Al BS

AFM Probe with 4 Different Long Scanning, DLC Hardened Cantilevers for Various Applications
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
Tap150DLC

Tap150DLC

Diamond-Like-Carbon Coated Soft Tapping Mode AFM Probe
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilever:
F 150 kHz
C 5 N/m
L 125 µm
Tap190DLC

Tap190DLC

Diamond-Like-Carbon Coated Tapping Mode AFM Probe with Long Cantilever
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
HQ:CSC17/Hard/Al BS

HQ:CSC17/Hard/Al BS

Long Scanning, DLC Hardened Contact Mode AFM Probe
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
ContDLC

ContDLC

Diamond-Like-Carbon Coated Contact Mode AFM Probe
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
All-In-One-DLC

All-In-One-DLC

Diamond-Like-Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 200 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
Contact-G

Contact-G

Standard Contact Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
HQ:CSC17/No Al

HQ:CSC17/No Al

Standard Contact Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
HQ:CSC37/Al BS

HQ:CSC37/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
HQ:CSC38/Al BS

HQ:CSC38/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
ContGD-G

ContGD-G

Gold Coated Contact Mode AFM Probe
Coating: Reflex Gold
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
HQ:CSC17/Cr-Au BS

HQ:CSC17/Cr-Au BS

Gold Coated Contact Mode AFM Probe
Coating: Reflex Gold
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
HQ:CSC37/No Al

HQ:CSC37/No Al

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
HQ:CSC38/No Al

HQ:CSC38/No Al

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
top value
HQ:DMD-XSC11

HQ:DMD-XSC11

AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications
Coating: Conductive Diamond
Tip Shape: Rotated
AFM Cantilevers: 4
F 18 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 210 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 95 N/m
L 100 µm
HQ:NSC36/Pt

HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
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