Rotated AFM Tips

AFM probes with rotated 4-sided pyramidal macroscopic shape of the AFM tips
118 results matching your criteria
HQ:DPER-XSC11

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical AFM Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15kHz
80kHz
155kHz
350kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
HQ:DPE-XSC11

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15kHz
80kHz
155kHz
350kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
HQ:NSC15/Pt

HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
325kHz
C
40 N/m
L
125 µm
ElectriAll-In-One

ElectriAll-In-One

Electrical AFM Probe with 4 Different AFM Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15kHz
80kHz
150kHz
350kHz
C
0.2 N/m
2.7 N/m
7.4 N/m
40 N/m
L
500 µm
210 µm
150 µm
100 µm
HQ:NSC14/Pt

HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
160kHz
C
5 N/m
L
125 µm
HQ:XSC11/Pt

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15kHz
80kHz
155kHz
350kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
ElectriTap300-G

ElectriTap300-G

Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
300kHz
C
40 N/m
L
125 µm
ElectriTap190-G

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
190kHz
C
48 N/m
L
225 µm
ElectriTap150-G

ElectriTap150-G

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
150kHz
C
5 N/m
L
125 µm
ElectriCont-G

ElectriCont-G

Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
13kHz
C
0.2 N/m
L
450 µm
HQ:CSC37/Pt

HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode AFM Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
40kHz
20kHz
30kHz
C
0.8 N/m
0.3 N/m
0.4 N/m
L
250 µm
350 µm
300 µm
HQ:CSC17/Pt

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
13kHz
C
0.18 N/m
L
450 µm
HQ:NSC18/Cr-Au

HQ:NSC18/Cr-Au

Gold Coated Force Modulation AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F
75kHz
C
2.8 N/m
L
225 µm
HQ:NSC19/Cr-Au

HQ:NSC19/Cr-Au

Gold Coated Force Modulation AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F
65kHz
C
0.5 N/m
L
125 µm
HQ:NSC35/Cr-Au

HQ:NSC35/Cr-Au

AFM Probe with 3 Different Gold Coated Tapping Mode AFM Cantilevers
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
205kHz
300kHz
150kHz
C
8.9 N/m
16 N/m
5.4 N/m
L
110 µm
90 µm
130 µm
HQ:NSC36/Cr-Au

HQ:NSC36/Cr-Au

AFM Probe with 3 Different Gold Coated Force Modulation Mode AFM Cantilevers
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
90kHz
130kHz
65kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
Multi75GB-G

Multi75GB-G

Gold Coated Force Modulation AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F
75kHz
C
3 N/m
L
225 µm
M-CIS

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
AFM Cantilever:
F
320kHz
C
40 N/m
L
120 µm
M1-HAR

M1-HAR

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM
Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
AFM Cantilever:
F
320kHz
C
40 N/m
L
120 µm
ContGB-G

ContGB-G

Gold Coated Contact Mode AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F
13kHz
C
0.2 N/m
L
450 µm
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