Rotated AFM Tips

HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

325 kHz

C

40 N/m

L

125 µm

ElectriAll-In-One

Electrical AFM Probe with 4 Different AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:NSC16/Pt

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

45 N/m

L

225 µm

HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

160 kHz

C

5 N/m

L

125 µm

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

ElectriTap150-G

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

ElectriCont-G

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

HQ:NSC18/Cr-Au

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC19/Cr-Au

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

65 kHz

C

0.5 N/m

L

125 µm

HQ:NSC35/Cr-Au

AFM Probe with 3 Different Gold Coated Tapping Mode AFM Cantilevers

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

205 kHz

300 kHz

150 kHz

C

8.9 N/m

16 N/m

5.4 N/m

L

110 µm

90 µm

130 µm

HQ:NSC36/Cr-Au

AFM Probe with 3 Different Gold Coated Force Modulation Mode AFM Cantilevers

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

Multi75GB-G

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm