Rotated AFM Tips

AFM probes with rotated 4-sided pyramidal macroscopic shape of the AFM tips
118 results matching your criteria
HQ:DPER-XSC11

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
HQ:DPE-XSC11

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
HQ:NSC15/Pt

HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
ElectriAll-In-One

ElectriAll-In-One

Electrical AFM Probe with 4 Different Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
HQ:NSC14/Pt

HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 160 kHz
C 5 N/m
L 125 µm
HQ:XSC11/Pt

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
ElectriTap300-G

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 300 kHz
C 40 N/m
L 125 µm
ElectriTap190-G

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long Cantilever
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
ElectriTap150-G

ElectriTap150-G

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 150 kHz
C 5 N/m
L 125 µm
ElectriCont-G

ElectriCont-G

Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
HQ:CSC37/Pt

HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
HQ:CSC17/Pt

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
HQ:NSC18/Cr-Au

HQ:NSC18/Cr-Au

Gold Coated Force Modulation AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
HQ:NSC19/Cr-Au

HQ:NSC19/Cr-Au

Gold Coated Force Modulation AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F 65 kHz
C 0.5 N/m
L 125 µm
HQ:NSC35/Cr-Au

HQ:NSC35/Cr-Au

AFM Probe with 3 Different Gold Coated Tapping Mode Cantilevers
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
HQ:NSC36/Cr-Au

HQ:NSC36/Cr-Au

AFM Probe with 3 Different Gold Coated Force Modulation Mode Cantilevers
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
Multi75GB-G

Multi75GB-G

Gold Coated Force Modulation AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F 75 kHz
C 3 N/m
L 225 µm
M-CIS

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
AFM Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
M1-HAR

M1-HAR

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM
Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
AFM Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
ContGB-G

ContGB-G

Gold Coated Contact Mode AFM Probe
Coating: Gold Overall
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
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