Non-Contact / Soft Tapping Mode AFM Probes

AFM probes with medium-soft AFM cantilevers for measuring soft samples in air or vacuum
59 results matching your criteria
Tap150-G

Tap150-G

Soft Tapping Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
150 kHz
C
5 N/m
L
125 µm
PPP-FM

PPP-FM

Standard Force Modulation AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
FM

FM

Standard Force Modulation AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
ARROW-FM

ARROW-FM

Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: none
Tip Shape: Arrow
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
240 µm
HQ:NSC14/No Al

HQ:NSC14/No Al

Soft Tapping Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
160 kHz
C
5 N/m
L
125 µm
HQ:NSC18/No Al

HQ:NSC18/No Al

Standard Force Modulation AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
HQ:NSC19/No Al

HQ:NSC19/No Al

Standard Force Modulation AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
65 kHz
C
0.5 N/m
L
125 µm
HQ:NSC35/No Al

HQ:NSC35/No Al

AFM Probe with 3 Different Tapping Mode AFM Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
205 kHz
300 kHz
150 kHz
C
8.9 N/m
16 N/m
5.4 N/m
L
110 µm
90 µm
130 µm
HQ:NSC36/No Al

HQ:NSC36/No Al

AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
90 kHz
130 kHz
65 kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
Multi75-G

Multi75-G

Standard Force Modulation AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
3XC-NN

3XC-NN

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers
Coating: none
Tip Shape: OPUS
AFM Cantilevers: 3
1
2
3
F
17 kHz
150 kHz
75 kHz
C
0.3 N/m
9 N/m
2.5 N/m
L
500 µm
175 µm
240 µm
HQ:XSC11/No Al

HQ:XSC11/No Al

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
155 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
All-In-One

All-In-One

AFM Probe with 4 Different AFM Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
150 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7.4 N/m
40 N/m
L
500 µm
210 µm
150 µm
100 µm
4XC-NN

4XC-NN

AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers
Coating: none
Tip Shape: OPUS
AFM Cantilevers: 4
1
2
3
4
F
17 kHz
75 kHz
150 kHz
1200 kHz
C
0.3 N/m
2.5 N/m
9 N/m
100 N/m
L
500 µm
240 µm
175 µm
65 µm
PPP-SEIH

PPP-SEIH

Special Tapping Mode AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
PPP-SEIHR

PPP-SEIHR

Special Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
SEIHR

SEIHR

Special Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
PPP-XYNCSTR

PPP-XYNCSTR

Soft Tapping Mode AFM Probe with Special Alignment System
Coating: Reflective Aluminum
Tip Shape: Standard
AFM Cantilever:
F
160 kHz
C
7.4 N/m
L
150 µm
NANOSENSORS™ Special Developments List (SDL)

NANOSENSORS™ Special Developments List (SDL)

Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating: various
Tip Shape: various
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