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Non-Contact / Soft Tapping Mode AFM Probes
AFM probes with medium-soft AFM cantilevers for measuring soft samples in air or vacuum
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61 results
HQ:NSC36/Al BS
AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
90 kHz
130 kHz
65 kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
240AC-NN
Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
none
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
70 kHz
C
2 N/m
L
240 µm
Tap150-G
Soft Tapping Mode AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
150 kHz
C
5 N/m
L
125 µm
PPP-FM
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
FM
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
ARROW-FM
Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating:
none
Tip Shape: Arrow
Tip Shape: Arrow
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
240 µm
HQ:NSC14/No Al
Soft Tapping Mode AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
160 kHz
C
5 N/m
L
125 µm
HQ:NSC18/No Al
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
HQ:NSC19/No Al
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
65 kHz
C
0.5 N/m
L
125 µm
HQ:NSC35/No Al
AFM Probe with 3 Different Tapping Mode AFM Cantilevers
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
205 kHz
300 kHz
150 kHz
C
8.9 N/m
16 N/m
5.4 N/m
L
110 µm
90 µm
130 µm
HQ:NSC36/No Al
AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
90 kHz
130 kHz
65 kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
Multi75-G
Standard Force Modulation AFM Probe
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
3XC-NN
AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM Tips at the Very End of the AFM Cantilevers
Coating:
none
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilevers: 3
1
2
3
F
17 kHz
150 kHz
75 kHz
C
0.3 N/m
9 N/m
2.5 N/m
L
500 µm
175 µm
240 µm
HQ:XSC11/No Al
AFM Probe with 4 Different Cantilevers for Various Applications
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
155 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7 N/m
42 N/m
L
500 µm
210 µm
150 µm
100 µm
All-In-One
AFM Probe with 4 Different AFM Cantilevers for Various Applications
Coating:
none
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
15 kHz
80 kHz
150 kHz
350 kHz
C
0.2 N/m
2.7 N/m
7.4 N/m
40 N/m
L
500 µm
210 µm
150 µm
100 µm
4XC-NN
AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers
Coating:
none
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilevers: 4
1
2
3
4
F
17 kHz
75 kHz
150 kHz
1200 kHz
C
0.3 N/m
2.5 N/m
9 N/m
100 N/m
L
500 µm
240 µm
175 µm
65 µm
PPP-SEIH
Special Tapping Mode AFM Probe
Coating:
none
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
PPP-SEIHR
Special Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
SEIHR
Special Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
PPP-XYNCSTR
Soft Tapping Mode AFM Probe with Special Alignment System
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
160 kHz
C
7.4 N/m
L
150 µm