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Silicon AFM Tips
AFM probes with silicon AFM tips
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281 results
SEIHR
Special Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
PPP-XYNCHR
Tapping Mode AFM Probe with Special Alignment System
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
PPP-XYNCSTR
Soft Tapping Mode AFM Probe with Special Alignment System
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
160 kHz
C
7.4 N/m
L
150 µm
SSS-SEIHR
SuperSharp, Special Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Supersharp
Tip Shape: Supersharp
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
SSS-SEIH
SuperSharp, Special Tapping Mode AFM Probe
Coating:
none
Tip Shape: Supersharp
Tip Shape: Supersharp
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
NW-SSS-SEIH
SuperSharp, Special Tapping Mode AFM Probe
Coating:
none
Tip Shape: Supersharp
Tip Shape: Supersharp
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm
PPP-ZEILR
Special Contact Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
27 kHz
C
1.6 N/m
L
450 µm
ZEILR
Special Contact Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
27 kHz
C
1.6 N/m
L
450 µm
PPP-XYCONTR
Contact Mode AFM Probe with Special Alignment System
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
New
BL-AC40TS
Tapping Mode AFM Probe for High-Speed Scanning in Liquids
Coating:
Reflective Gold
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
110 kHz
C
0.1 N/m
L
38 µm
Q-WM190-SSS
Premounted, SuperSharp Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Supersharp
Tip Shape: Supersharp
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
Q-AR5
Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: High-Aspect-Ratio
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
Q-WM300
Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
300 kHz
C
40 N/m
L
125 µm
Q-CONT
Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
Q-EFM
Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-MFM
Premounted Hard Magnetic, Medium Momentum MFM AFM Probe, for Quesant/Ambios AFM systems
Coating:
Magnetic
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-Cond-E
Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
Q-WM75
Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-WM150
Premounted Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
150 kHz
C
5 N/m
L
125 µm
best bang for your buck
Q-WM190
Premounted Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm