Non-Contact / Tapping Mode AFM Probes

top value

3XC-NA

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Optimized Positioning

AFM Cantilevers: 3

1

2

3

F

17 kHz

150 kHz

75 kHz

C

0.3 N/m

9 N/m

2.5 N/m

L

500 µm

175 µm

240 µm

160AC-NN

Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilever:

F

300 kHz

C

26 N/m

L

160 µm

Tap300-G

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Tap190-G

Tapping Mode AFM Probe with Long AFM Cantilever

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

Tap150-G

Soft Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

HQ:NSC14/No Al

Soft Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

160 kHz

C

5 N/m

L

125 µm

HQ:NSC35/No Al

AFM Probe with 3 Different Tapping Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

205 kHz

300 kHz

150 kHz

C

8.9 N/m

16 N/m

5.4 N/m

L

110 µm

90 µm

130 µm

3XC-NN

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilevers: 3

1

2

3

F

17 kHz

150 kHz

75 kHz

C

0.3 N/m

9 N/m

2.5 N/m

L

500 µm

175 µm

240 µm

HQ:XSC11/No Al

AFM Probe with 4 Different Cantilevers for Various Applications

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

All-In-One

AFM Probe with 4 Different AFM Cantilevers for Various Applications

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

USC-F2-k3

Ultra-Short Cantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

2000 kHz

C

3 N/m

L

10 µm

USC-F1.2-k7.3

Ultra-Short Cantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

1200 kHz

C

7.3 N/m

L

20 µm

the industry standard

ARROW-UHF

Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflective Aluminum
Tip Shape: Arrow

AFM Cantilever:

F

2000 kHz

C

x

L

35 µm

4XC-NN

AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilevers: 4

1

2

3

4

F

17 kHz

75 kHz

150 kHz

1200 kHz

C

0.3 N/m

2.5 N/m

9 N/m

100 N/m

L

500 µm

240 µm

175 µm

65 µm

USC-F1.5-k0.6

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid

Coating: Reflective Gold
Tip Shape: Cone Shaped,EBD

AFM Cantilever:

F

1500 kHz

C

0.6 N/m

L

7 µm

PPP-ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

PPP-SEIH

Special Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm