Silicon AFM Support Chips

AFM probes with silicon support chips
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390 results
PPP-CONTSCAuD
PPP-CONTSCAuD
Gold Coated Contact Mode AFM Probe with Short AFM Cantilever
Coating: Reflective Gold
Tip Shape: Standard
AFM Cantilever:
F
25 kHz
C
0.2 N/m
L
225 µm
HQ:CSC17/Cr-Au BS
HQ:CSC17/Cr-Au BS
Gold Coated Contact Mode AFM Probe
Coating: Reflective Gold
Tip Shape: Rotated
AFM Cantilever:
F
13 kHz
C
0.18 N/m
L
450 µm
HQ:CSC37/No Al
HQ:CSC37/No Al
AFM Probe with 3 Different Contact Mode AFM Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
40 kHz
20 kHz
30 kHz
C
0.8 N/m
0.3 N/m
0.4 N/m
L
250 µm
350 µm
300 µm
HQ:CSC38/No Al
HQ:CSC38/No Al
AFM Probe with 3 Different Contact Mode AFM Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
20 kHz
10 kHz
14 kHz
C
0.09 N/m
0.03 N/m
0.05 N/m
L
250 µm
350 µm
300 µm
PPP-BSI
PPP-BSI
Soft Contact AFM Probe for Biological Applications
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
28 kHz
C
0.1 N/m
L
225 µm
top value
160AC-FG
160AC-FG
High Aspect Ratio, Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
New
240AC-FG
240AC-FG
High Aspect Ratio, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
70 kHz
C
2 N/m
L
240 µm
EBD-AR15T
EBD-AR15T
High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM
Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
AFM Cantilever:
F
330 kHz
C
40 N/m
L
125 µm
AR10-NCHR
AR10-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
AR5-NCHR
AR5-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
AR5-NCH
AR5-NCH
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
NW-AR10-NCHR
NW-AR10-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
NW-AR5-NCHR
NW-AR5-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
AR5-NCLR
AR5-NCLR
High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NW-AR5-NCLR
NW-AR5-NCLR
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
CDT-NCHR
CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
CDT-NCLR
CDT-NCLR
Diamond Coated, Conductive Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
210 kHz
C
72 N/m
L
225 µm
NW-CDT-NCHR
NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
NW-CDT-NCLR
NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F
210 kHz
C
72 N/m
L
225 µm
PPP-NCHPt
PPP-NCHPt
Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
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