Contact Mode AFM Probes

General static mode measurements
49 results matching your criteria
HQ:XSC11/No Al

HQ:XSC11/No Al

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
All-In-One

All-In-One

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
4XC-NN

4XC-NN

AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers
Coating: none
Tip Shape: OPUS
AFM Cantilevers: 4
F 17 kHz
C 0.3 N/m
L 500 µm
F 75 kHz
C 2.5 N/m
L 240 µm
F 150 kHz
C 9 N/m
L 175 µm
F 1200 kHz
C 100 N/m
L 65 µm
PPP-CONT

PPP-CONT

Standard Contact Mode AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
qp-CONT

qp-CONT

uniqprobe™ - uniform quality SPM probe for contact mode
Coating: Reflex Gold
Tip Shape: Circular symmetric
AFM Cantilever:
F 30 kHz
C 0.1 N/m
L 125 µm
best of the best
qp-SCONT

qp-SCONT

uniqprobe™ - uniform quality SPM probe for soft contact mode
Coating: Reflex Gold
Tip Shape: Circular symmetric
AFM Cantilever:
F 11 kHz
C 0.01 N/m
L 125 µm
CONT

CONT

Standard Contact Mode AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
ESP

ESP

Standard Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip Shape: Standard
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
CONTSCR

CONTSCR

Contact Mode AFM Probe with Short Cantilever
Coating: Reflex Aluminum
Tip Shape: Standard
AFM Cantilever:
F 25 kHz
C 0.2 N/m
L 225 µm
Contact-G

Contact-G

Standard Contact Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
best bang for your buck
SiNi

SiNi

Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip
Coating: Reflex Gold
Tip Shape: Pyramid
AFM Cantilevers: 4
F 30 kHz
C 0.27 N/m
L 100 µm
F 10 kHz
C 0.06 N/m
L 200 µm
HQ:CSC17/No Al

HQ:CSC17/No Al

Standard Contact Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
HQ:CSC37/Al BS

HQ:CSC37/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
Mix and Match Box

Mix and Match Box

Mixed box: up to 400 MikroMasch AFM probes
Coating: various
Tip Shape: various
HQ:CSC38/Al BS

HQ:CSC38/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
ARROW-CONT

ARROW-CONT

Contact Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: none
Tip Shape: Arrow
AFM Cantilever:
F 14 kHz
C 0.2 N/m
L 450 µm
CONTSC

CONTSC

Contact Mode AFM Probe with Short Cantilever
Coating: none
Tip Shape: Standard
AFM Cantilever:
F 25 kHz
C 0.2 N/m
L 225 µm
PPP-CONTAuD

PPP-CONTAuD

Gold Coated Contact Mode AFM Probe
Coating: Reflex Gold
Tip Shape: Standard
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
PPP-CONTSCAuD

PPP-CONTSCAuD

Gold Coated Contact Mode AFM Probe with Short Cantilever
Coating: Reflex Gold
Tip Shape: Standard
AFM Cantilever:
F 25 kHz
C 0.2 N/m
L 225 µm
ContGD-G

ContGD-G

Gold Coated Contact Mode AFM Probe
Coating: Reflex Gold
Tip Shape: Rotated
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
3