Scanning Capacitance Microscopy and Piezoresponse Force Microscopy AFM Probes

Electrical characterization in contact mode (SCM, PFM, etc.)
51 results matching your criteria
best of the best
CDT-FMR

CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
best of the best
PPP-EFM

PPP-EFM

Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
ATEC-EFM

ATEC-EFM

Electrical, Force Modulation AFM Probe with REAL Tip Visibility
Coating: Electrically Conductive
Tip Shape: Visible
AFM Cantilever:
F 85 kHz
C 2.8 N/m
L 240 µm
PtSi-CONT

PtSi-CONT

Electrical, Contact Mode AFM Probes
Coating: Platinum Silicide Overall
Tip Shape: Standard
AFM Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
the industry standard
NW-CDT-FMR

NW-CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
ARROW-EFM

ARROW-EFM

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: Arrow
AFM Cantilever:
F 75 kHz
C 2.8 N/m
L 240 µm
the industry standard
EFM

EFM

Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
top value
HQ:NSC18/Pt

HQ:NSC18/Pt

Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
top value
240AC-PP

240AC-PP

Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating: Electrically Conductive
Tip Shape: OPUS
AFM Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
best bang for your buck
ElectriMulti75-G

ElectriMulti75-G

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 75 kHz
C 3 N/m
L 225 µm
best of the best
PtSi-FM

PtSi-FM

Electrical, Force Modulation AFM Probes
Coating: Platinum Silicide Overall
Tip Shape: Standard
AFM Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
CDT-CONTR

CDT-CONTR

Diamond Coated, Conductive Contact Mode AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F 20 kHz
C 0.5 N/m
L 450 µm
DDESP-FM

DDESP-FM

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond
Tip Shape: Standard
AFM Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
OSCM-PT

OSCM-PT

Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating: Electrically Conductive
Tip Shape: OPUS
AFM Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
HQ:NSC35/Pt

HQ:NSC35/Pt

AFM Probe with 3 Different Electrical, Tapping Mode AFM Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
best bang for your buck
All-In-One-DD

All-In-One-DD

Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers
Coating: Conductive Diamond
Tip Shape: Rotated
AFM Cantilevers: 4
F 19 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 200 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 100 N/m
L 100 µm
top value
HQ:DMD-XSC11

HQ:DMD-XSC11

AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications
Coating: Conductive Diamond
Tip Shape: Rotated
AFM Cantilevers: 4
F 18 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 210 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 95 N/m
L 100 µm
HQ:NSC36/Pt

HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode AFM Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
HQ:DPER-XSC11

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
HQ:DPE-XSC11

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
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