Conductive AFM Probes

Electrical characterization (EFM, KPFM, SSRM, TUNA, etc.)

81 results matching your criteria
NW-CDT-NCHR

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F 400 kHz
C 80 N/m
L 125 µm
NW-CDT-NCLR

NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
AFM Cantilever:
F 210 kHz
C 72 N/m
L 225 µm
PPP-NCHPt

PPP-NCHPt

Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
ATEC-NCPt

ATEC-NCPt

Electrical, Tapping Mode AFM Probe with REAL Tip Visibility
Coating: Electrically Conductive
Tip Shape: Visible
AFM Cantilever:
F 335 kHz
C 45 N/m
L 160 µm
PPP-NCSTPt

PPP-NCSTPt

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F 160 kHz
C 7.4 N/m
L 150 µm
PPP-NCLPt

PPP-NCLPt

Electrical, Tapping Mode AFM Probe with a Long Cantilever
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
NCHPt

NCHPt

Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
ARROW-NCPt

ARROW-NCPt

Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: Arrow
AFM Cantilever:
F 285 kHz
C 42 N/m
L 160 µm
top value
HQ:DMD-XSC11

HQ:DMD-XSC11

AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications
Coating: Conductive Diamond
Tip Shape: Rotated
AFM Cantilevers: 4
F 18 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 210 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 95 N/m
L 100 µm
HQ:NSC36/Pt

HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
HQ:DPER-XSC11

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
HQ:DPE-XSC11

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
Mix and Match Box

Mix and Match Box

Mixed box: up to 400 MikroMasch AFM probes
Coating: various
Tip Shape: various
HQ:NSC15/Pt

HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
ElectriAll-In-One

ElectriAll-In-One

Electrical AFM Probe with 4 Different Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
HQ:NSC14/Pt

HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 160 kHz
C 5 N/m
L 125 µm
HQ:XSC11/Pt

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
ElectriTap300-G

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 300 kHz
C 40 N/m
L 125 µm
ElectriTap190-G

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with Long Cantilever
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
ElectriTap150-G

ElectriTap150-G

Electrical, Soft Tapping Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F 150 kHz
C 5 N/m
L 125 µm
5